Monthly Archives: July 2015

Asigurarea Calităţii – Quality Assurance, Vol. XVII, Issue 67, July-September 2011

Quick View Table of Contents Quality Award Models versus Self-Assessment. A Comparative Study Ton van der Wiele Statistical Multivariate Process Control based on FNAD Methodology Irina Adjudeanu, Ioan Bacivarov, Angelica Bacivarov Investigations Regarding Thin Films and Coatings Used in Microelectronic Devices M. Ignat, A.C. Seguineau, Chouaf, X. Lafontan, J.-M. Desmarres A Study Concerning Service Quality […]

Asigurarea Calităţii – Quality Assurance, Vol. XVII, Issue 68, October-December 2011

Quick View Table of Contents Quality in Higher Education – A Competitive Intelligence Based Approach Maria Cristina Mendonça A Contingency Approach in Quality Management A. van der Wiele, J.D. Van Iwaarden, S. Eldridge Package-on-Package (PoP), warpage, and Reliability Titu-Marius I. Băjenescu Influenţa calităţii materialului semiconductor asupra fiabilităţii componentelor electronice active Marius Bâzu Actualities and Perspectives […]

Asigurarea Calităţii – Quality Assurance, Vol. XVIII, Issue 69, January-March 2012

Quick View Table of Contents Construction of a Contextualized Quality Problem-Solving Method Laetitia Avrillon, Maurice Pillet On Virtual Machine Survivability Analysis Ioan-Cosmin Mihai, Angelica Bacivarov, Ioan C. Bacivarov Advances and Trends in Microelectronic Packaging Titu-Marius I. Băjenescu Integrarea unor tehnici de analiză a fiabilităţii software în biblioteca JReliability Constantin-Eugen Cornel, Angelica Bacivarov, Ioan Bacivarov

Asigurarea Calităţii – Quality Assurance, Vol. XVIII, Issue 70, April-June 2012

Quick View Table of Contents Post-Manufacturing Traceability: Legal/Market Trends and Best Practices David Balme Fp-Petri Nets: A Tool for Complex Systems Modelling Mihaela Barreau, Jean-Yves Morel, Cristina Morel Modelling Ageing of Optocoupler Titu-Marius I. Băjenescu Moduri şi mecanisme de defectare ale diodelor cu siliciu M. Bâzu, T. Băjenescu Total Quality Management in Large Organizations Alan […]

Asigurarea Calităţii – Quality Assurance, Vol. XVIII, Issue 71, July-September 2012

Quick View Table of Contents The 13th International Conference in Quality and Dependability CCF2012 – A Jubilee Edition Dan G. Stoichiţoiu, Ioan C. Bacivarov Message of EFQM Representative Gianluca Mulé Addressed to the Participants at CCF 2012 From Quality Management to Sustainable Excellence: EFQM Excellence Model Gianluca Mulé A Comparative Study of the Motives for […]

Asigurarea Calităţii – Quality Assurance, Vol. XVIII, Issue 72, October-December 2012

Quick View Table of Contents Asigurarea survivabilităţii sistemelor informatice complexe Costel Ciuchi, Laura Iancu, Gabriel Petrică, Ioan Bacivarov, Angelica Bacivarov Defectarea componentelor electronice, fiabilitatea sistemului şi ingineria de investigaţie Titu I. Băjenescu, Marius I. Bâzu The Use of Expert Systems in Evaluating the Quality of Universities Websites Traian-Lucian Militaru, George Suciu, Gyorgy Todoran A Reliability […]

Asigurarea Calităţii – Quality Assurance, Vol. IXX, Issue 73, January-March 2013

Quick View Table of Contents Instrumente manageriale în asigurarea securităţii sistemelor informatice Costel Ciuchi, Angelica Bacivarov Quality Management Fads and Organisational Change Ton van der Wiele, Barrie Dale, Roger Williams Mechanical Stability of Thin Film On Substrate Systems Michel Ignat Total Quality of Knowledge Content Adrian Mihalache, Viorel Ionescu Predicţia fiabilităţii bazată pe fizica defectării […]

Asigurarea Calităţii – Quality Assurance, Vol. IXX, Issue 74, April-June 2013

Quick View Table of Contents 20 de ani SRAC Dan G. Stoichiţoiu Societatea Română pentru Asigurarea Calităţii – promotor al culturii calităţii în România Marin Drăgulinescu Asigurarea calităţii – Quality Assurance. Două decenii de promovare a culturii calităţii Ioan C. Bacivarov Joseph M. Juran. Un OM pentru istoria calităţii Ioan C. Bacivarov Starea calităţii în […]

Asigurarea Calităţii – Quality Assurance, Vol. IXX, Issue 75, July-September 2013

Quick View Table of Contents Quality Management versus Risk Management Ton van der Wiele, Jos van Iwaarden, Roger Williams, Barie Dale, Boudewijn Bertsch, Mark Smith, Rolf Visser Quality Politics: Costs and Return of Investments R. Lupan, C. Robledo, I. C. Bacivarov, Angelica Bacivarov Reliability Considerations at Nanometer Scale Angelica-Beatrice Bacivarov Superconductivity Applications and Reliability Titu-Marius […]